Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6492247 | Method for eliminating crack damage induced by delaminating gate conductor interfaces in integrated circuits | William H. Guthrie, Michael Ruprecht | 2002-12-10 |
| 5899706 | Method of reducing loading variation during etch processing | Lars Liebmann, Frank Prein, Thomas Zell | 1999-05-04 |