Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 6492247 | Method for eliminating crack damage induced by delaminating gate conductor interfaces in integrated circuits | William H. Guthrie, Michael Ruprecht | 2002-12-10 | $14,124,000 |
| 5899706 | Method of reducing loading variation during etch processing | Lars Liebmann, Frank Prein, Thomas Zell | 1999-05-04 | $26,914,000 |