Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10768226 | Testing mechanism for a proximity fail probability of defects across integrated chips | Kirk D. Peterson, Andrew A. Turner | 2020-09-08 |
| 10114071 | Testing mechanism for a proximity fail probability of defects across integrated chips | Kirk D. Peterson, Andrew A. Turner | 2018-10-30 |