Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6787783 | Apparatus and techniques for scanning electron beam based chip repair | Herschel M. Marchman | 2004-09-07 |
| 6730237 | Focused ion beam process for removal of copper | Michael Sievers, Steven B. Herschbein | 2004-05-04 |