Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8199336 | Optical measurement apparatus, spectroscopic ellipsometer, recording medium, and measurement method | Eric Minet | 2012-06-12 |
| 8013997 | Sample analyzing method, sample analyzing apparatus, manufacturing method of organic EL element, manufacturing equipment, and recording medium | Yoko Wasai | 2011-09-06 |
| 7688446 | Sample analyzing method, sample analyzing apparatus, manufacturing method of organic EL element, manufacturing equipment, and recording medium | Yoko Wasai | 2010-03-30 |
| 7567872 | Film forming condition determination method, film forming method, and film structure manufacturing method | Hiroshi Funakubo, Yoshihisa Honda, Asuka Terai | 2009-07-28 |
| 7280210 | Measuring method, analyzing method, measuring apparatus, analyzing apparatus, ellipsometer, and computer program | Yoko Wasai | 2007-10-09 |
| 7280208 | Optical characteristic analysis method, sample measuring apparatus and spectroscopic ellipsometer | Hiroshi Funakubo, Yoshihisa Honda, Asuka Terai | 2007-10-09 |
| 7271901 | Thin-film characteristic measuring method using spectroellipsometer | Yoko Wasai | 2007-09-18 |
| 7196793 | Method for analyzing thin-film layer structure using spectroscopic ellipsometer | Yoko Wasai | 2007-03-27 |
| 7167242 | Sample analysis method | Seiichi Hirakawa, Yoko Wasai | 2007-01-23 |