Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8013997 | Sample analyzing method, sample analyzing apparatus, manufacturing method of organic EL element, manufacturing equipment, and recording medium | Nataliya Nabatova-Gabain | 2011-09-06 |
| 7688446 | Sample analyzing method, sample analyzing apparatus, manufacturing method of organic EL element, manufacturing equipment, and recording medium | Nataliya Nabatova-Gabain | 2010-03-30 |
| 7280210 | Measuring method, analyzing method, measuring apparatus, analyzing apparatus, ellipsometer, and computer program | Nataliya Nabatova-Gabain | 2007-10-09 |
| 7271901 | Thin-film characteristic measuring method using spectroellipsometer | Nataliya Nabatova-Gabain | 2007-09-18 |
| 7196793 | Method for analyzing thin-film layer structure using spectroscopic ellipsometer | Nataliya Nabatova-Gabain | 2007-03-27 |
| 7167242 | Sample analysis method | Nataliya Nabatova-Gabain, Seiichi Hirakawa | 2007-01-23 |