Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10178753 | Micro-structured atomic source system | James Goeders, Thomas Ohnstein, Terry Dean Stark | 2019-01-08 |
| 9788407 | Micro-structured atomic source system | James Goeders, Thomas Ohnstein, Terry Dean Stark | 2017-10-10 |
| 9625622 | Aspheric variable focal length lens systems and methods | Matthew Edward Lewis Jungwirth | 2017-04-18 |
| 9585237 | Micro-structured atomic source system | James Goeders, Thomas Ohnstein, Terry Dean Stark | 2017-02-28 |
| 9104011 | Light collector devices | Bernard S. Fritz | 2015-08-11 |
| 8853637 | Particle based neutron detector | — | 2014-10-07 |
| 8633784 | Misalignment tolerant contactless RF coupling device | Conrad Ihla, Robert C. Becker, Glen Backes, Alan Cornett | 2014-01-21 |
| 8523074 | Bar code imagers | Bernard S. Fritz | 2013-09-03 |
| 8451447 | Photoacoustic sensor | Bernard S. Fritz | 2013-05-28 |
| 8387883 | Bar code imagers | Bernard S. Fritz | 2013-03-05 |
| 8085403 | Photoacoustic sensor | Bernard S. Fritz | 2011-12-27 |
| 7895880 | Photoacoustic cell incorporating a quantum dot substrate | Bernard S. Fritz | 2011-03-01 |
| 7808640 | Photoacoustic spectroscopy system | Bernard Fritz | 2010-10-05 |
| 7780761 | Adsorptive gas sampler using ionic nano-droplets | Alex Gu, Wei Yang, Adam Dewey McBrady | 2010-08-24 |
| 6979819 | Photoelectron emission microscope for wafer and reticle inspection | David L. Adler | 2005-12-27 |
| 6610980 | Apparatus for inspection of semiconductor wafers and masks using a low energy electron microscope with two illuminating beams | Lee H. Veneklasen, David L. Adler | 2003-08-26 |