QL

Qing Liu

Foxconn: 32 patents #126 of 5,504Top 3%
TE Tencent: 30 patents #98 of 8,131Top 2%
Huawei: 8 patents #1,713 of 15,535Top 15%
FC Fine M-Tec Co.: 6 patents #7 of 97Top 8%
Lam Research: 6 patents #476 of 2,128Top 25%
EM Emc: 6 patents #530 of 3,345Top 20%
UL University Of Notre Dame Du Lac: 4 patents #48 of 437Top 15%
AT AT&T: 3 patents #5,550 of 18,772Top 30%
Samsung: 2 patents #37,631 of 75,807Top 50%
ST Smart Antenna Technologies: 2 patents #4 of 11Top 40%
Nokia: 1 patents #2,812 of 5,652Top 50%
IX Ixia: 1 patents #120 of 245Top 50%
ZT Zte: 1 patents #1,433 of 3,593Top 40%
HC Hong Fu Precision Industry (Shenzhen) Co.: 1 patents #26 of 146Top 20%
DU Duke University: 1 patents #1,064 of 2,315Top 50%
BC Beijing Bytedance Network Technology Co.: 1 patents #308 of 765Top 45%
📍 Nanhu, MA: #1 of 42 inventorsTop 3%
Overall (All Time): #25,638 of 4,157,543Top 1%
75
Patents All Time

Issued Patents All Time

Showing 51–75 of 75 patents

Patent #TitleCo-InventorsDate
8052033 Friction stir welding method Koichi Nakagawa, Isao Shiozawa, Takeo Nakagawa 2011-11-08
8021965 Inter-chip communication Gary H. Bernstein, Patrick Fay, Wolfgang Porod 2011-09-20
7971770 Friction stir method Koichi Nakagawa, Isao Shiozawa, Takeo Nakagawa 2011-07-05
7973539 Methods for measuring dielectric properties of parts Jaehyun Kim, Arthur H. Sato, Keith Comendant, Feiyang Wu 2011-07-05
7930533 PXE booting a storage processor from a peer storage processor Ying Chun Guo, Kevin Richards 2011-04-19
7911213 Methods for measuring dielectric properties of parts Jaehyun Kim, Arthur H. Sato, Keith Comendant, Feiyang Wu 2011-03-22
7800383 Apparatus and method for testing keyboard of mobile phone Chang Shao 2010-09-21
7782450 Testing system and testing method for keyboard light of mobile phone Yong Xiao 2010-08-24
7777500 Methods for characterizing dielectric properties of parts Jaehyun Kim, Arthur H. Sato, Keith Comendant, Feiyang Wu 2010-08-17
7756673 Measuring device for measuring aspects of objects Jun Li 2010-07-13
7726036 Contour measuring probe Jun Li, Takeo Nakagawa 2010-06-01
7725290 Contour measuring method for measuring aspects of objects Jun Li, Takeo Nakagawa 2010-05-25
7694425 Measuring device and method for using the same Jun Li 2010-04-13
7681323 Base and contour measuring system using the same Jun Li 2010-03-23
7654008 Contour measuring method for measuring aspects of objects Jun Li, Takeo Nakagawa 2010-02-02
7650701 Contour measuring probe Jun Li 2010-01-26
7608919 Interconnect packaging systems Gary H. Bernstein, Patrick Fay, Wolfgang Porod 2009-10-27
7597034 Machining method employing oblique workpiece spindle Jun Li 2009-10-06
7594338 Contour measuring probe for measuring aspects of objects Jian Kong 2009-09-29
7490413 Contour measuring device with error correcting unit Jun Li, Takeo Nakagawa 2009-02-17
7398603 Distance measuring probe with air discharge system Jun Li, Takeo Nakagawa 2008-07-15
7266100 Session updating procedure for authentication, authorization and accounting Yanqun Le, Dan Forsberg 2007-09-04
7079634 Apparatus for tracking connection of service provider customers via customer use patterns David E. Kaufman, Anna Olecka 2006-07-18
6700960 Apparatus for tracking connection of service provider customers via customer use patterns David E. Kaufman, Anna Olecka 2004-03-02
6483908 Method for tracking connection of service provider customers via customer use patterns David E. Kaufman, Anna Olecka 2002-11-19