Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6072899 | Method and device of inspecting three-dimensional shape defect | Hideaki Doi, Hiroya Koshishiba, Mineo Nomoto | 2000-06-06 |
| 5930382 | Wiring pattern inspecting method and system for carrying out the same | Hideaki Doi, Yasuhiko Hara, Tadashi Iida, Yasuhiro Fujishita, Yasuo Nakagawa +1 more | 1999-07-27 |