Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9024544 | Field emission device | Masayoshi Nagao, Tomoya Yoshida | 2015-05-05 |
| 8405294 | Field emission electron source | Takahiro Matsumoto | 2013-03-26 |
| 7876113 | Method of inspecting pattern and inspecting instrument | Mari Nozoe, Mitsuo Suga, Hidetoshi Nishiyama | 2011-01-25 |
| 6924482 | Method of inspecting pattern and inspecting instrument | Mari Nozoe, Mitsuo Suga, Hidetoshi Nishiyama | 2005-08-02 |
| 6859060 | Inspection method of semiconductor device and inspection system | Mari Nozoe | 2005-02-22 |
| 6586952 | Method of inspecting pattern and inspecting instrument | Mari Nozoe, Mitsuo Suga, Hidetoshi Nishiyama | 2003-07-01 |