Issued Patents All Time
Showing 26–36 of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9507895 | Simulation apparatus and simulation method for determining soft error rates for a configured model | Kenichi Shimbo, Hidefumi Ibe, Hideki Osaka | 2016-11-29 |
| 9489324 | Data processing device, semiconductor external view inspection device, and data volume increase alleviation method | Yuichi Sakurai, Ken Iizumi, Katsunori Hirano, Hideki Osaka | 2016-11-08 |
| 8904233 | Electronic apparatus | Hidefumi Ibe, Kenichi Shimbo, Hitoshi Taniguchi | 2014-12-02 |
| 8892967 | Measurement device and measurement method | Hidefumi Ibe, Ken-ichi Shimbo, Hitoshi Taniguchi | 2014-11-18 |
| 8385627 | Method and apparatus for inspecting defects of semiconductor device | Shuji Kikuchi, Yuichi Sakurai, Wen Li | 2013-02-26 |
| 8304726 | Test apparatus | Katsunori Hirano, Masahiro Ohashi, Masashi Wada | 2012-11-06 |
| 8032332 | Semiconductor inspecting apparatus | Yuichi Sakurai, Shuji Kikuchi | 2011-10-04 |
| 7952072 | Test apparatus | Katsunori Hirano, Masahiro Ohashi, Masashi Wada | 2011-05-31 |
| 7870428 | Method of diagnosing circuit board, circuit board, and CPU unit | Katsunori Hirano, Yuji Sonoda | 2011-01-11 |
| 7137055 | Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memory | Katsunori Hirano, Shuji Kikuchi, Yuji Sonoda, Wen Li, Takashi Kanesaka +1 more | 2006-11-14 |
| 7114110 | Semiconductor device, and the method of testing or making of the semiconductor device | Shuji Kikuchi, Katsunori Hirano, Yuji Sonoda, Takeshi Wada | 2006-09-26 |