Issued Patents All Time
Showing 126–150 of 165 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6357913 | Add/drop acousto-optic filter | Byoung Y. Kim, Seok-Hyun Yun | 2002-03-19 |
| 6343165 | Optical add drop multiplexer | Byoung Y. Kim, Seok-Hyun Yun, Hee Su Park | 2002-01-29 |
| 6316764 | Autoalignment and autofocus mechanism for coupling light between an optical fiber and a physical specimen | Brian L. Heffner | 2001-11-13 |
| 6259529 | Wavelength-selective polarization-diverse optical heterodyne receiver | Douglas M. Baney | 2001-07-10 |
| 6256103 | System and method for optical heterodyne detection of an optical signal | Douglas M. Baney | 2001-07-03 |
| 6215118 | Autoalignment and autofocus mechanism for coupling light between an optical fiber and a physical specimen | Brian L. Heffner | 2001-04-10 |
| 6208774 | Polarization independent light switching device based on liquid crystals | Douglas M. Baney | 2001-03-27 |
| 6198856 | Optical switch having test ports | Dale W. Schroeder, David K. Donald, Shalini Venkatesh | 2001-03-06 |
| 6157753 | Programmable light path device | Douglas M. Baney | 2000-12-05 |
| 6091744 | Wavelength selectable source for wavelength division multiplexed applications | Douglas M. Baney | 2000-07-18 |
| 6088491 | Optical circulator | Douglas M. Baney | 2000-07-11 |
| 5991476 | Pump directed optical switching element | Douglas M. Baney, Steven A. Newton | 1999-11-23 |
| 5982791 | Wavelength tracking in adjustable optical systems | Douglas M. Baney | 1999-11-09 |
| 5850287 | Roller assembly having pre-aligned for on-line thickness measurements | Shalini Venkatesh, Brian L. Heffner | 1998-12-15 |
| 5731876 | Method and apparatus for on-line determination of the thickness of a multilayer film using a partially reflecting roller and low coherence reflectometry | Shalini Venkatesh, Brian L. Heffner | 1998-03-24 |
| 5684586 | Apparatus for characterizing short optical pulses | Rance Fortenberry | 1997-11-04 |
| 5646734 | Method and apparatus for independently measuring the thickness and index of refraction of films using low coherence reflectometry | Shalini Venkatesh | 1997-07-08 |
| 5642196 | Method and apparatus for measuring the thickness of a film using low coherence reflectometry | Ronald V. Alves, Steven A. Newton | 1997-06-24 |
| 5633712 | Method and apparatus for determining the thickness and index of refraction of a film using low coherence reflectometry and a reference surfaces | Shalini Venkatesh, Brian L. Heffner | 1997-05-27 |
| 5610716 | Method and apparatus for measuring film thickness utilizing the slope of the phase of the Fourier transform of an autocorrelator signal | Brian L. Heffner, Shalini Venkatesh | 1997-03-11 |
| 5557400 | Multiplexed sensing using optical coherence reflectrometry | Douglas M. Baney | 1996-09-17 |
| 5473432 | Apparatus for measuring the thickness of a moving film utilizing an adjustable numerical aperture lens | — | 1995-12-05 |
| 5446578 | Polarization preserving optical isolator | Kok-Wai Chang | 1995-08-29 |
| 5365531 | Apparatus and method for initializing an optical-fiber laser for mode locking | Hong-Yu Lin, David K. Donald | 1994-11-15 |
| 5365335 | Optical low-coherence reflectometer using optical attenuation | — | 1994-11-15 |