Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5642196 | Method and apparatus for measuring the thickness of a film using low coherence reflectometry | Wayne V. Sorin, Steven A. Newton | 1997-06-24 |
| 4558217 | Multiplexing and calibration techniques for optical signal measuring instruments | — | 1985-12-10 |
| 4459044 | Optical system for an instrument to detect the temperature of an optical fiber phosphor probe | — | 1984-07-10 |