Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7976387 | Free-standing input device | Akihiro Machida | 2011-07-12 |
| 7978174 | System and method for interactive three-dimensional position tracking | Soo Sean Lim, Lye Hock Bernard Chan, Tong Sen Liew, Nobutaka Itagaki | 2011-07-12 |
| 7912315 | Method and system for reducing artifacts in image detection | Richard Haven | 2011-03-22 |
| 7812822 | Opto-mechanical pointing devices that track the movement of rollers positioned at the base of the pointing devices | Annette Grot, Julie E. Fouquet | 2010-10-12 |
| 7593586 | Method and system for reducing artifacts in image detection | Richard Haven | 2009-09-22 |
| 7580545 | Method and system for determining gaze direction in a pupil detection system | — | 2009-08-25 |
| 7450250 | Method and apparatus for determining surface displacement based on an image of a retroreflector attached to the surface | Richard Haven, John Wenstrand | 2008-11-11 |
| 7399954 | System and method for an optical navigation device configured to generate navigation information through an optically transparent layer and to have skating functionality | — | 2008-07-15 |
| 7106511 | Imaging system with large depth of field | Annette Grot | 2006-09-12 |
| 6798939 | Bubble stability in an optical switch | Frederick A. Stawitcke, Datong Chen, Richard Haven, Mark A. Troll, David Anvar | 2004-09-28 |
| 6668107 | Method and apparatus for reducing optical insertion loss in planar lightwave circuits through dielectric perturbation optimization | Marshall DePue, Hisato Uetsuka, Hiroaki Okano | 2003-12-23 |
| 6198856 | Optical switch having test ports | Dale W. Schroeder, David K. Donald, Wayne V. Sorin | 2001-03-06 |
| 5850287 | Roller assembly having pre-aligned for on-line thickness measurements | Wayne V. Sorin, Brian L. Heffner | 1998-12-15 |
| 5731876 | Method and apparatus for on-line determination of the thickness of a multilayer film using a partially reflecting roller and low coherence reflectometry | Brian L. Heffner, Wayne V. Sorin | 1998-03-24 |
| 5646734 | Method and apparatus for independently measuring the thickness and index of refraction of films using low coherence reflectometry | Wayne V. Sorin | 1997-07-08 |
| 5633712 | Method and apparatus for determining the thickness and index of refraction of a film using low coherence reflectometry and a reference surfaces | Wayne V. Sorin, Brian L. Heffner | 1997-05-27 |
| 5610716 | Method and apparatus for measuring film thickness utilizing the slope of the phase of the Fourier transform of an autocorrelator signal | Wayne V. Sorin, Brian L. Heffner | 1997-03-11 |