Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10654193 | Methods and system for controlling a surface profile of a wafer | Peter Albrecht, Carlos Zavattari, Sumeet S. Bhagavat, Vandan Tanna | 2020-05-19 |
| 10315337 | Methods and system for controlling a surface profile of a wafer | Peter Albrecht, Carlo Zavattari, Sumeet S. Bhagavat, Vandan Tanna | 2019-06-11 |
| 7026831 | Method and device for measuring the diffusion length of minority carriers in a semiconductor sample | — | 2006-04-11 |