Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12276696 | Defect detection using thermal laser stimulation and atomic force microscopy | Gavin CORCORAN, Jungwon KIM, Seung Hwan Lee, Mark Gruidl, Karthik Kalaiazhagan +1 more | 2025-04-15 |
| 9964589 | System for detection of a photon emission generated by a device and methods for detecting the same | Lei Zhu, Pik Kee Tan, Zhihong Mai, Jeffrey Lam | 2018-05-08 |