Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12276696 | Defect detection using thermal laser stimulation and atomic force microscopy | Huei Hao Yap, Jungwon KIM, Seung Hwan Lee, Mark Gruidl, Karthik Kalaiazhagan +1 more | 2025-04-15 |