Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10152784 | System and method for detecting defects in a component | Venkata Vijayaraghava Nalladega, Thomas James Batzinger, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, Bryon Edward Knight +1 more | 2018-12-11 |