MN

Masato Nakashima

Fujitsu Limited: 35 patents #572 of 24,456Top 3%
Kyocera: 2 patents #1,365 of 3,732Top 40%
AA A. Aoki & Associates: 1 patents #1 of 16Top 7%
UM University Of Massachusetts: 1 patents #755 of 1,810Top 45%
YA Yazaki: 1 patents #2,077 of 3,427Top 65%
📍 Yokohama, MA: #14 of 47 inventorsTop 30%
Overall (All Time): #83,464 of 4,157,543Top 3%
39
Patents All Time

Issued Patents All Time

Showing 26–39 of 39 patents

Patent #TitleCo-InventorsDate
5589957 Stereoscopic display apparatus using cylindrical screen Hirokazu Aritake, Masayuki Kato 1996-12-31
5570208 Stereoscopic display method of hologram and its forming method and stereoscopic display apparatus Masayuki Kato, Hirokazu Aritake, Manabu Ishimoto, Noriko Sato 1996-10-29
5513020 Stereoscopic display apparatus use a holographic phase distribution formed from two-dimensional images Masayuki Kato, Hirokazu Arikate, Manabu Ishimoto, Noriko Sato 1996-04-30
5497189 Stereoscopic display apparatus Hirokazu Aritake, Masayuki Kato, Manabu Ishimoto, Noriko Sato 1996-03-05
5497170 Headup display apparatus Masayuki Kato, Hirokazu Aritake, Tsuyoshi Matsumoto, Junji Tomita, Fumio Yamagishi +4 more 1996-03-05
5400155 Hologram information forming method Akihiko Ueda, Hirokuni Monzen, Hirokazu Aritake, Masayuki Kato 1995-03-21
5298989 Method of and apparatus for multi-image inspection of bonding wire Hiroyuki Tsukahara, Yoshitaka Oshima 1994-03-29
5004929 Optical system for detecting three-dimensional shape Yoshikazu Kakinoki, Tetsuo Koezuka, Noriyuki Hiraoka, Hiroyuki Tsukahara, Yoshinori Suto +2 more 1991-04-02
4805224 Pattern matching method and apparatus Tetsuo Koezuka, Hiroyuki Tsukahara 1989-02-14
4672678 Pattern recognition apparatus Tetsuo Koezuka, Noriyuki Hiraoka, Hiroyuki Tsukahara 1987-06-09
4651341 Pattern recognition apparatus and a pattern recognition method Tetsuo Koezuka, Hiroyuki Tsukahara, Takefumi Inagaki 1987-03-17
4547895 Pattern inspection system Kikuo Mita, Masayuki Oyama, Takashi Yoshida, Katsumi Fujihara, Tadao Nakakuki 1985-10-15
4450579 Recognition method and apparatus Tetsuo Koezuka, Takefumi Inagaki 1984-05-22
4392120 Pattern inspection system Kikuo Mita, Masayuki Oyama, Takashi Yoshida, Katsumi Fujihara, Tadao Nakakuki 1983-07-05