Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7593596 | Phase unwrapping method, program, and interference measurement apparatus | Fumiyuki Takahashi | 2009-09-22 |
| 7443516 | Optical-distortion correcting apparatus and optical-distortion correcting method | Fumiyuki Takahashi, Takashi Fuse | 2008-10-28 |
| 6555836 | Method and apparatus for inspecting bumps and determining height from a regular reflection region | Fumiyuki Takahashi, Yoshitaka Oshima, Youji Nishiyama, Takashi Fuse | 2003-04-29 |
| 6104493 | Method and apparatus for visual inspection of bump array | Takashi Fuse, Youji Nishiyama, Yoshitaka Oshima, Fumiyuki Takahashi | 2000-08-15 |
| 6052189 | Height measurement device and height measurement method | Takashi Fuse, Yoshitaka Oshima, Youji Nishiyama, Fumiyuki Takahashi | 2000-04-18 |
| 5999266 | Method for inspecting height, and a height inspection apparatus to carry out the method | Fumiyuki Takahashi, Yoshitaka Oshima, Youji Nishiyama, Takashi Fuse | 1999-12-07 |
| 5298989 | Method of and apparatus for multi-image inspection of bonding wire | Yoshitaka Oshima, Masato Nakashima | 1994-03-29 |
| 5243406 | Method and apparatus for measuring three-dimensional configuration of wire-shaped object in a short time | Moritoshi Ando, Yoshitaka Oshima | 1993-09-07 |
| 5004929 | Optical system for detecting three-dimensional shape | Yoshikazu Kakinoki, Masato Nakashima, Tetsuo Koezuka, Noriyuki Hiraoka, Yoshinori Suto +2 more | 1991-04-02 |
| 4805224 | Pattern matching method and apparatus | Tetsuo Koezuka, Masato Nakashima | 1989-02-14 |
| 4672678 | Pattern recognition apparatus | Tetsuo Koezuka, Noriyuki Hiraoka, Masato Nakashima | 1987-06-09 |
| 4651341 | Pattern recognition apparatus and a pattern recognition method | Masato Nakashima, Tetsuo Koezuka, Takefumi Inagaki | 1987-03-17 |