Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11468026 | Information processing apparatus, information processing method, and recording medium recording information processing program | Taizan Kobayashi, Reizo Nakamura | 2022-10-11 |
| 8941841 | Displacement measurement device, displacement measurement method, and displacement measurement program | Katsuki Shirai, Taizan Kobayashi | 2015-01-27 |
| 8736295 | Semiconductor testing circuit, semiconductor testing jig, semiconductor testing apparatus, and semiconductor testing method | Yuichi Watanabe, Kiyotaka Shinada, Yuushin Kimura, Shigeru Goto, Yasuhiko Tandou +1 more | 2014-05-27 |
| 7096396 | Test system for circuits | Shuichi Kameyama, Takeshi Yanase | 2006-08-22 |