Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8835327 | Method of manufacturing semiconductor device | Masanori Terahara, Hikaru Kokura, Akihiro Hasegawa, Fumihiko Akaboshi | 2014-09-16 |
| 8073241 | Defect source analysis method, defect source analysis apparatus, and method of manufacturing semiconductor device | Yasuo Matsumiya, Yasuhiro Suzuki, Akihiro Shimada | 2011-12-06 |
| 6197646 | Manufacture of semiconductor device with salicide electrode | Kenichi Goto, Tatsuya Yamazaki, Yuzuru Ota, Hideo Takagi, Keisuke Okazaki | 2001-03-06 |
| 6008111 | Method of manufacturing semiconductor device | Kenichi Goto, Tatsuya Yamazaki, Takae Sukegawa, Masataka Kase, Takashi Sakuma +3 more | 1999-12-28 |
| 5635426 | Method of making a semiconductor device having a silicide local interconnect | Hiromi Hayashi, Tetsuo Izawa, Masaki Katsube, Tatsuya Yamazaki | 1997-06-03 |
| 5576244 | Method of manufacturing semiconductor devices having silicide electrodes | Hiromi Hayashi | 1996-11-19 |
| 5482895 | Method of manufacturing semiconductor devices having silicide electrodes | Hiromi Hayashi | 1996-01-09 |