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Anton Riley — 2 Patents

FEFei: 1 patents #375 of 681Top 60%
MUMultiprobe: 1 patents #3 of 4Top 75%
Santa Ynez, CA: #22 of 54 inventorsTop 45%
California: #187,151 of 386,348 inventorsTop 50%
Overall (All Time): #1,709,992 of 4,157,543Top 45%
2 Patents All Time
Anton Riley has been granted 2 US patents while listed as an inventor at Fei. The first was granted in 2014 and the most recent in November 2018. Anton Riley ranks #1,709,992 of 4,157,543 US inventors in our database (top 41.1%). Patent records list Anton Riley in Santa Ynez, CA, US.

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10139429 Method for calibrating and imaging using multi-tip scanning probe microscope Sean Zumwalt, Jordan Ray Fine, Rohit Jain 2018-11-27
8800998 Semiconductor wafer isolated transfer chuck Andrew Norman Erickson, Jeffrey M. Markakis 2014-08-12

Frequent Collaborators

Sean Zumwalt1 shared
Jeffrey M. Markakis1 shared
Andrew Norman Erickson1 shared
Rohit Jain1 shared
Jordan Ray Fine1 shared

Nearby-Ranked Inventors

Leonard Mattheis2
Yiqi SHI2
Roberto DiCecco2
Haoneng Xu2
Emily Chew2
So Young Bae2
Julian Alexander Georgi2
Yoshihiro Asahara2
Assaf Ariel2