Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10139429 | Method for calibrating and imaging using multi-tip scanning probe microscope | Sean Zumwalt, Jordan Ray Fine, Rohit Jain | 2018-11-27 |
| 8800998 | Semiconductor wafer isolated transfer chuck | Andrew Norman Erickson, Jeffrey M. Markakis | 2014-08-12 |