JF

Jordan Ray Fine

FE Fei: 1 patents #375 of 681Top 60%
📍 Ventura, CA: #459 of 881 inventorsTop 55%
🗺 California: #247,236 of 386,348 inventorsTop 65%
Overall (All Time): #2,920,087 of 4,157,543Top 75%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10139429 Method for calibrating and imaging using multi-tip scanning probe microscope Sean Zumwalt, Anton Riley, Rohit Jain 2018-11-27