JF

Jordan Ray Fine

FE Fei: 1 patents #375 of 681Top 60%
Overall (All Time): #2,920,087 of 4,157,543Top 75%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10139429 Method for calibrating and imaging using multi-tip scanning probe microscope Sean Zumwalt, Anton Riley, Rohit Jain 2018-11-27