| 9411015 |
Semiconductor device having penetrating electrodes each penetrating through substrate |
Manabu Ishimatsu, Naoki Ogawa |
2016-08-09 |
| 9379600 |
Semiconductor device that can cancel noise in bias line to which bias current flows |
Isao Nakamura, Manabu Ishimatsu |
2016-06-28 |
| 9368189 |
Semiconductor device including output circuit constituted of plural unit buffer circuits in which impedance thereof are adjustable |
Koji Uemura, Manabu Ishimatsu |
2016-06-14 |
| 9053771 |
Semiconductor system |
— |
2015-06-09 |
| 8952498 |
Semiconductor device having plural stacked chips |
Yasuyuki Shigezane, Akira Ide |
2015-02-10 |
| 8766664 |
Semiconductor device including output circuit constituted of plural unit buffer circuits in which impedance thereof are adjustable |
Koji Uemura, Manabu Ishimatsu |
2014-07-01 |
| 8760902 |
Semiconductor system |
— |
2014-06-24 |
| 8717839 |
Semiconductor device having plural penetration electrodes penetrating through semiconductor substrate and testing method thereof |
Yasuyuki Shigezane |
2014-05-06 |
| 8665008 |
Semiconductor device that can cancel noise in bias line to which bias current flows |
Isao Nakamura, Manabu Ishimatsu |
2014-03-04 |
| 8390318 |
Semiconductor device having calibration circuit for adjusting output impedance of output buffer circuit |
Takanori Eguchi, Manabu Ishimatsu |
2013-03-05 |
| 7986150 |
Calibration circuit |
— |
2011-07-26 |
| 6809946 |
Semiconductor memory device and method of controlling the same |
Hiroki Fujisawa |
2004-10-26 |