Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8498831 | Semiconductor device, semiconductor device testing method, and data processing system | Akira Ide, Hideyuki Yoko, Kayoko Shibata, Kenichi Tanamachi, Yasuyuki Shigezane +2 more | 2013-07-30 |
| 8390318 | Semiconductor device having calibration circuit for adjusting output impedance of output buffer circuit | Hideyuki Yokou, Manabu Ishimatsu | 2013-03-05 |