Issued Patents All Time
Showing 76–76 of 76 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5808735 | Method for characterizing defects on semiconductor wafers | Ken Kinsun Lee, Lakshman Srinivasan, Bruce W. Worster | 1998-09-15 |
KH
Ke Han
Intel: 25 patents #1,576 of 30,777Top 6%
Florida State University: 5 patents #73 of 597Top 15%
Maxtor: 3 patents #132 of 656Top 25%
Ultrapointe: 2 patents #5 of 16Top 35%
Quantum: 1 patents #325 of 703Top 50%
Honeywell: 1 patents #7,507 of 14,447Top 55%
Kla-Tencor: 1 patents #809 of 1,394Top 60%
Xi'An Jiaotong University: 1 patents #201 of 791Top 30%
Siemens Aktiengesellschaft: 1 patents #10,653 of 22,248Top 50%
Overall (All Time): #24,832 of 4,157,543Top 1%
76
Patents All Time