Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8899459 | Breaking apparatus and breaking method for substrate made of brittle material | Ikuyoshi Nakatani | 2014-12-02 |
| 7206074 | Apparatus and method for measuring spectral reflectance and apparatus for measuring film thickness | Hiroki Fujimoto, Eiji Nishihara | 2007-04-17 |
| 7140395 | Brake hose | Kenichiro Furui, Satoshi Mizutani, Shigeki Okuhara | 2006-11-28 |
| 6104864 | Moving image judging | Eijiro Narukawa | 2000-08-15 |
| 5314831 | Method of and apparatus for evaluating crystal rate in silicon thin film | Sadao Hirae, Seiichiro Sato | 1994-05-24 |
| 5120966 | Method of and apparatus for measuring film thickness | — | 1992-06-09 |
| 5101111 | Method of measuring thickness of film with a reference sample having a known reflectance | — | 1992-03-31 |
| 4988198 | Method and apparatus for measuring microlevel difference | — | 1991-01-29 |
| 4984894 | Method of and apparatus for measuring film thickness | — | 1991-01-15 |
| 4676647 | Film thickness measuring device and method | Atsushi Kikkawa | 1987-06-30 |
| 4659936 | Line width measuring device and method | Atsushi Kikkawa, Atsushi Tamada | 1987-04-21 |