Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7679730 | Surface inspection apparatus and surface inspection method for strained silicon wafer | Hideaki Takano, Miyuki Shimizu, Takeshi Senda, Koji Izunome, Yoshinori Hayashi | 2010-03-16 |
| 7403278 | Surface inspection apparatus and surface inspection method | Yoshinori Hayashi, Hiroyuki Naraidate, Makoto Kyoya, Koji Izunome, Hiromi Nagahama +1 more | 2008-07-22 |
| 4794531 | Unsharp masking for image enhancement | Koichi Morishita, Shimbu Yamagata, Tetsuo Okabe, Tetsuo Yokoyama | 1988-12-27 |