Issued Patents All Time
Showing 1–25 of 39 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11605716 | Nitride semiconductor substrate and method of manufacturing the same | Hiroshi Oishi, Jun Komiyama, Kenichi Eriguchi | 2023-03-14 |
| 11280677 | Colorimeter capable of taking a fixed posture with respect to a measurement object | Hiroki Aomatsu, Shinichi Iida, Wataru Yamaguchi, Yoshitaka Teraoka | 2022-03-22 |
| 11201217 | Nitride semiconductor substrate | Kenichi Eriguchi, Jun Komiyama | 2021-12-14 |
| 11089225 | Optical measuring device, image generating method, and image generating program | Koji Yamamoto, Satoshi Yokota, Norimasa Kubota, Yuta Yamanoi, Masaaki Chigasaki +1 more | 2021-08-10 |
| 10825895 | Nitride semiconductor substrate | Kenichi Eriguchi, Jun Komiyama | 2020-11-03 |
| 10593790 | Nitride semiconductor substrate and method for manufacturing the same | Masashi Kobata, Shintaro Miyamoto | 2020-03-17 |
| 10559679 | Nitride semiconductor epitaxial substrate | Hiroshi Oishi, Noriko Omori | 2020-02-11 |
| 10522386 | Susceptor and method for manufacturing same | Masato Shinohara, Satoru Nogami | 2019-12-31 |
| 10068858 | Compound semiconductor substrate | Kenichi Eriguchi, Noriko Omori, Hiroshi Oishi, Jun Komiyama | 2018-09-04 |
| 9976905 | Surface characteristic measurement device | Yosuke Takebe | 2018-05-22 |
| 9885668 | Surface inspection device, surface inspection method, and program | Takafumi Komatsu, Wataru Yamaguchi, Yosuke Takebe | 2018-02-06 |
| 9748344 | Nitride semiconductor substrate having recesses at interface between base substrate and initial nitride | Noriko Omori, Hiroshi Oishi, Jun Komiyama, Kenichi Eriguchi, Tomoko Watanabe | 2017-08-29 |
| 9536955 | Nitride semiconductor substrate | Jun Komiyama, Kenichi Eriguchi, Akira Yoshida, Hiroshi Oishi, Shunichi Suzuki | 2017-01-03 |
| 9530846 | Nitride semiconductor substrate | Noriko Omori, Hiroshi Oishi, Jun Komiyama, Kenichi Eriguchi | 2016-12-27 |
| 9435018 | Method for carburizing tantalum container | Masanari Watanabe | 2016-09-06 |
| 8986466 | Method for carburizing tantalum member, and tantalum member | Masanari Watanabe, Osamu Tamura | 2015-03-24 |
| 8785942 | Nitride semiconductor substrate and method of manufacturing the same | Akira Yoshida, Jun Komiyama, Hiroshi Oishi, Kenichi Eriguchi, Shunichi Suzuki | 2014-07-22 |
| 8637960 | Nitride semiconductor substrate | Jun Komiyama, Hiroshi Oishi, Akira Yoshida, Kenichi Eriguchi, Shunichi Suzuki | 2014-01-28 |
| 8538137 | Image processing apparatus, information processing system, and image processing method | Hironori Sumitomo | 2013-09-17 |
| 8216667 | Tantalum carbide-coated carbon material and production method thereof | Hirokazu Fujiwara, Norimasa Yamada | 2012-07-10 |
| 8212288 | Compound semiconductor substrate comprising a multilayer buffer layer | Jun Komiyama, Kenichi Eriguchi, Hiroshi Oishi, Akira Yoshida, Shunichi Suzuki | 2012-07-03 |
| 8148753 | Compound semiconductor substrate having multiple buffer layers | Hiroshi Oishi, Jun Komiyama, Kenichi Eriguchi, Akira Yoshida, Shunichi Suzuki | 2012-04-03 |
| 8121814 | Three-dimensional processor and method for controlling display of three-dimensional data in the three-dimensional processor | Toshio Kawano | 2012-02-21 |
| 7812969 | Three-dimensional shape measuring apparatus | Koji Morimoto, Shinichi Horita | 2010-10-12 |
| 7764386 | Method and system for three-dimensional measurement and method and device for controlling manipulator | Shinichi Horita | 2010-07-27 |