CH

Christian Holzner

CM Carl Zeiss X-Ray Microscopy: 2 patents #14 of 37Top 40%
CG Carl Zeiss Industrielle Messtechnik Gmbh: 1 patents #97 of 238Top 45%
📍 Neuenkirchen, DE: #11 of 61 inventorsTop 20%
Overall (All Time): #1,126,576 of 4,157,543Top 30%
4
Patents All Time

Issued Patents All Time

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
11633918 Method and device for additive manufacturing utilizing simulation test results of a workpiece Michael Totzeck, Danny Krautz, Diana SPENGLER, Uwe Wolf, Christoph-Hilmar Graf Vom HAGEN +1 more 2023-04-25
9383324 Laboratory X-ray micro-tomography system with crystallographic grain orientation mapping capabilities Michael Feser, Erik Mejdal Lauridsen 2016-07-05
9222900 X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus Erik Mejdal Lauridsen, Stefan Othmar POULSEN, Michael Feser 2015-12-29
9110004 Laboratory x-ray micro-tomography system with crystallographic grain orientation mapping capabilities Michael Feser, Erik Mejdal Lauridsen 2015-08-18