Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9222900 | X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus | Erik Mejdal Lauridsen, Christian Holzner, Michael Feser | 2015-12-29 |
| 9222901 | X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus | Erik Mejdal Lauridsen, Peter Reischig | 2015-12-29 |