Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7805279 | Remote maintenance system | Nobuaki Ogushi, Hirohisa Ohta, Masaya Ogura | 2010-09-28 |
| 7062343 | Remote maintenance system | Nobuaki Ogushi, Hirohisa Ohta, Masaya Ogura | 2006-06-13 |
| 6963786 | Remote maintenance system | Nobuaki Ogushi, Hirohisa Ohta, Masaya Ogura | 2005-11-08 |
| 6892109 | Remote maintenance system | Nobuaki Ogushi, Hirohisa Ohta, Masaya Ogura | 2005-05-10 |
| 6801913 | Medical instrument control system | Isao Matsumura | 2004-10-05 |
| 6385497 | Remote maintenance system | Nobuaki Ogushi, Hirohisa Ohta, Masaya Ogura | 2002-05-07 |
| 5871587 | Processing system for semiconductor device manufacture of otherwise | Takayuki Hasegawa, Hidehiko Fujioka | 1999-02-16 |
| 5828572 | Processing System and semiconductor device production method using the same including air conditioning control in operational zones | Takayuki Hasegawa, Hidehiko Fujioka | 1998-10-27 |
| 5599502 | Liquid moving apparatus and measuring apparatus utilizing the same | Takeshi Miyazaki, Matsuomi Nishimura, Kazuo Isaka, Kazumi Tanaka, Toshikazu Ohnishi +1 more | 1997-02-04 |
| 5370842 | Sample measuring device and sample measuring system | Takeshi Miyazaki, Matsuomi Nishimura, Takayuki Yagi, Kazumi Tanaka, Toshikazu Ohnishi +3 more | 1994-12-06 |
| 5275787 | Apparatus for separating or measuring particles to be examined in a sample fluid | Naoki Yuguchi, Junichi Yamayoshi | 1994-01-04 |
| 5182617 | Sample supply device and sample inspection apparatus using the device | Yoshiyuki Toge, Naoki Yuguchi | 1993-01-26 |
| 5180065 | Apparatus for and method of fractionating particle in particle-suspended liquid in conformity with the properties thereof | Yoshiyuki Touge | 1993-01-19 |