Issued Patents All Time
Showing 26–28 of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7418693 | System and method for analysis and transformation of layouts using situations | Ya-Chieh Lai, Matthew W. Moskewicz, Michael C. Lam, Gregory R. McIntyre | 2008-08-26 |
| 7155698 | Method of locating areas in an image such as a photo mask layout that are sensitive to residual processing effects | — | 2006-12-26 |
| 7030997 | Characterizing aberrations in an imaging lens and applications to visual testing and integrated circuit mask analysis | Andrew Neureuther, Kostas Adam, Garth C. Robins | 2006-04-18 |