Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7089516 | Measurement of integrated circuit interconnect process parameters | Narain D. Arora, Li Song | 2006-08-08 |
| 7024638 | Method for creating patterns for producing integrated circuits | Louis K. Scheffer, Kenji Yoshida, Yoshikuni Abe, Robert C. Pack | 2006-04-04 |