Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7088121 | Non-contact method and apparatus for on-line interconnect characterization in VLSI circuits | Rimma A. Pirogova | 2006-08-08 |
| 7089516 | Measurement of integrated circuit interconnect process parameters | Li Song, Aki Fujimura | 2006-08-08 |
| 5999010 | Method of measuring interconnect coupling capacitance in an IC chip | Jian Wang | 1999-12-07 |