Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9869694 | Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode | Chunzeng Li, Yan Hu, Ji Ma, Jianli He, Lin Huang +4 more | 2018-01-16 |
| 9213047 | Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode | Chunzeng Li, Yan Hu, Ji Ma, Jianli He, Lin Huang +4 more | 2015-12-15 |
| 9116168 | Low drift scanning probe microscope | Anthonius Ruiter | 2015-08-25 |
| 8869310 | Low drift scanning probe microscope | Anthonius Ruiter | 2014-10-21 |
| 7886583 | Apparatus and method of amplifying low voltage signals | Carl Masser | 2011-02-15 |