Issued Patents All Time
Showing 25 most recent of 41 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10803634 | Reconstruction of three dimensional model of an object compensating for object orientation changes between surface or slice scans | Michael Sullivan | 2020-10-13 |
| 10475179 | Compensating for reference misalignment during inspection of parts | Timothy Pinkney | 2019-11-12 |
| 10412311 | Focus adjustment for surface part inspection | Timothy Pinkney | 2019-09-10 |
| 10054802 | Topology guided ocular lens design | Michael Sullivan, Steve Auger | 2018-08-21 |
| 9972101 | Reconstruction of three dimensional model of an object from surface or slice scans compensating for motion blur | Michael Sullivan | 2018-05-15 |
| D786279 | Display screen with graphical user interface for a viscometer or rheometer | Teresa L. McKim, James A. Salomon, Alex Mak, Charles Falzarano | 2017-05-09 |
| 9489753 | Reconstruction of three dimensional model of an object from surface or slice scans compensating for motion blur | Michael Sullivan | 2016-11-08 |
| 9398845 | Method and apparatus for determining eye topology | — | 2016-07-26 |
| 9402036 | Scanning operation with concurrent focus and inspection | Timothy Pinkney | 2016-07-26 |
| 9113091 | High speed autofocus system | Timothy Pinkney | 2015-08-18 |
| 7015445 | Method for optimizing inspection speed in low, and fluorescent light applications without sacrificing signal to noise ratio, resolution, or focus quality | — | 2006-03-21 |
| 6603877 | Method of and apparatus for optical imaging inspection of multi-material objects and the like | — | 2003-08-05 |
| 6427024 | APPARATUS FOR AND METHOD OF AUTOMATIC OPTICAL INSPECTION OF ELECTRONIC CIRCUIT BOARDS, WAFERS AND THE LIKE FOR DEFECTS, USING SKELETAL REFERENCE INSPECTION AND SEPARATELY PROGRAMMABLE ALIGNMENT TOLERANCE AND DETECTION PARAMETERS | — | 2002-07-30 |
| 6091488 | Method of and apparatus for automatic high-speed optical inspection of semi-conductor structures and the like through fluorescent photoresist inspection | — | 2000-07-18 |
| 6036831 | Automatic protein and/or DNA analysis system and method | — | 2000-03-14 |
| 6014209 | Method of optically inspecting multi-layered electronic parts and the like with fluorescent scattering top layer discrimination and apparatus therefor | — | 2000-01-11 |
| 6007231 | Method of computer aided automated diagnostic DNA test design, and apparatus therefor | Jan Vijg | 1999-12-28 |
| 5874666 | Spindle quick-connect and rotary viscometer | — | 1999-02-23 |
| 5865975 | Automatic protein and/or DNA analysis system and method | — | 1999-02-02 |
| 5827972 | High pressure sensor apparatus with low cost compact packaging system | Richard J. Balcarek, Robert Louis Bartosh, Bryan J. Dague, Douglas B. Strott, John M. Armacost +1 more | 1998-10-27 |
| 5544399 | Method for making a pressure transducer | Paul L. Hainey | 1996-08-13 |
| 5531102 | Viscometer usable in situ in large reactor vessels | David A. Brookfield | 1996-07-02 |
| 5524152 | Method of and apparatus for object or surface inspection employing multicolor reflection discrimination | Richard Damon | 1996-06-04 |
| 5499158 | Pressure transducer apparatus with monolithic body of ceramic material | Paul L. Hainey, Stanley J. Lukasiewicz, Allan J. Siuzdak, Robert E. Luminello, Jr., Vishwa N. Shukla | 1996-03-12 |
| 5485345 | Pressure transducer apparatus | Stanley J. Lukasiewicz, Robert O. Southworth, Keith W. Kawate | 1996-01-16 |