Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6830939 | System and method for determining endpoint in etch processes using partial least squares discriminant analysis in the time domain of optical emission spectra | Kenneth C. Harvey, Jimmy W. Hosch, Neal B. Gallagher | 2004-12-14 |
| 6606567 | Methods for characterizing, classifying, and identifying unknowns in samples | Jay W. Grate | 2003-08-12 |
| 6408250 | Methods for characterizing, classifying, and identifying unknowns in samples | Jay W. Grate | 2002-06-18 |