Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6883113 | System and method for temporally isolating environmentally sensitive integrated circuit faults | Bruce McWilliam, Ronald C. Todd | 2005-04-19 |
| 6697978 | Method for testing of known good die | Michael J. Bear | 2004-02-24 |
| 5517515 | Multichip module with integrated test circuitry disposed within interposer substrate | Edward J. Spall | 1996-05-14 |
| 4852061 | High density, high performance register file having improved clocking means | Henry C. Baron, Johnny LeBlanc, Joseph W. Yoder | 1989-07-25 |