YS

Yih-Cheng Shih

AT AT&T: 2 patents #7,280 of 18,772Top 40%
MC Macronix International Co.: 1 patents #718 of 1,241Top 60%
IBM: 1 patents #44,794 of 70,183Top 65%
📍 Middletown, NJ: #137 of 464 inventorsTop 30%
🗺 New Jersey: #19,416 of 69,400 inventorsTop 30%
Overall (All Time): #1,266,786 of 4,157,543Top 35%
4
Patents All Time

Issued Patents All Time

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
6799152 Critical dimension statistical process control in semiconductor fabrication Chih-Ping Chen, Shao-Chung Hsu, De Chuan Liu, Jung-Kuei Lu, Cheng-Yi Lin +3 more 2004-09-28
5712193 Method of treating metal nitride films to reduce silicon migration therein Glen Roy Hower, Daniel David Kostelnick 1998-01-27
5344797 Method of forming interlevel dielectric for integrated circuits Chien-Shing Pai 1994-09-06
4853346 Ohmic contacts for semiconductor devices and method for forming ohmic contacts John Baker, Alessandro C. Callegari, Dianne L. Lacey 1989-08-01