Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7117060 | Method of improving production through cost of yield measurement | Thomas A. McPhee, Michael E. Cropp, Donald W. DiAngelo, Alberto H. Gay, Carmella Pemberton +2 more | 2006-10-03 |
| 6195200 | High power multiwavelength light source | Justin Boyd Judkins, Paul F. Wysocki | 2001-02-27 |
| 5633103 | Self-aligned alignment marks for phase-shifting masks | Christophe Pierrat | 1997-05-27 |
| 5589303 | Self-aligned opaque regions for attenuating phase-shifting masks | Taeho Kook, Robert L. Kostelak, Jr. | 1996-12-31 |
| 5538819 | Self-aligned alignment marks for phase-shifting masks | Robert L. Kostelak, Jr. | 1996-07-23 |
| 5288368 | Electron beam lithography with reduced charging effects | Christophe Pierrat | 1994-02-22 |