Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5057441 | Method for reliability testing integrated circuit metal films | Gregory M. Gutt, Robert V. Knoell, Ronald J. Schutz | 1991-10-15 |
| 4737233 | Method for making semiconductor crystal films | Ernest Labate, Joseph Raymond Ligenza, Simon M. Sze | 1988-04-12 |
| 4623912 | Nitrided silicon dioxide layers for semiconductor integrated circuits | Chuan-Chung Chang, Dawon Kahng, Louis C. Parrillo | 1986-11-18 |
| 4364779 | Fabrication of semiconductor devices including double annealing steps for radiation hardening | Ashok Sinha | 1982-12-21 |