Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11681231 | Selecting a set of locations associated with a measurement or feature on a substrate | Pierluigi FRISCO, Jochem Sebastiaan Wildenberg | 2023-06-20 |
| 11327406 | Estimating a parameter of a substrate | Jochem Sebastiaan Wildenberg, Roy Werkman, Luc Roumen | 2022-05-10 |
| 11294289 | Selecting a set of locations associated with a measurement or feature on a substrate | Pierluigi FRISCO, Jochem Sebastiaan Wildenberg | 2022-04-05 |