Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11994806 | Metrology method and apparatus, computer program and lithographic system | Alexandru ONOSE, Remco Dirks, Sander Silvester Adelgondus Marie JACOBS, Frank Jaco BUIJNSTERS, Siebe Tjerk De Zwart +2 more | 2024-05-28 |