Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7649636 | Optical metrology system and metrology mark characterization device | Nicolaas Petrus Van Der Aa, Arie Jeffrey Den Boef, Henricus Gerhardus Ter Morsche | 2010-01-19 |