KP

Kuo-Feng PAO

AB Asml Netherlands B.V.: 2 patents #1,484 of 3,192Top 50%
Overall (All Time): #1,951,525 of 4,157,543Top 50%
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Patent #TitleCo-InventorsDate
9939735 Method of determining focus, inspection apparatus, patterning device, substrate and device manufacturing method Paul Christiaan Hinnen, Shu-jin Wang, Christian Marinus Leewis 2018-04-10
9594299 Method of determining focus, inspection apparatus, patterning device, substrate and device manufacturing method Paul Christiaan Hinnen, Shu-jin Wang, Christian Marinus Leewis 2017-03-14