Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11300883 | Method to determine a patterning process parameter | Martin Jacobus Johan Jak, Simon Gijsbert Josephus Mathijssen, Kaustuve Bhattacharyya, Won-Jae Jang | 2022-04-12 |
| 10908513 | Metrology method and apparatus and computer program | Marc Johannes Noot, Simon Gijsbert Josephus Mathijssen, Kaustuve Bhattacharyya, Hyun-Su Kim, Won-Jae Jang +1 more | 2021-02-02 |