Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11372338 | Method for evaluating control strategies in a semiconductor manufacturing process | Ivo Matteo Leonardus Weijden, Jeroen VAN DONGEN, Cornelis Johannes Henricus LAMBREGTS, Theo Wilhelmus Maria THIJSSEN, Ruud Rudolphus Johannes Catharinus De Wit +5 more | 2022-06-28 |
| 9971478 | Method and apparatus for inspection and metrology | Everhardus Cornelis Mos, Ajith Ganesan | 2018-05-15 |