Jed Davidow — 6 Patents at Applied Materials

Jed Davidow has been granted 6 US patents while listed as an inventor at Applied Materials. The first was granted in 2002 and the most recent in May 2005. Jed Davidow ranks #779,687 of 4,157,543 US inventors in our database (top 18.8%). Patent records list Jed Davidow in Santa Clara, CA, US.

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Showing 1–6 of 6 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
6896763	Method and apparatus for monitoring a process by employing principal component analysis	Lalitha Balasubramhanya, Moshe Sarfaty, Dimitris Lymberopoulos	2005-05-24
6589869	Film thickness control using spectral interferometry	Moshe Sarfaty, Lalitha Balasubramhanya, Dimitris Lymberopoulos	2003-07-08	$32,858,000
6521080	Method and apparatus for monitoring a process by employing principal component analysis	Lalitha Balasubramhanya, Moshe Sarfaty, Dimitris Lymberopoulos	2003-02-18	$21,472,000
6455437	Method and apparatus for monitoring the process state of a semiconductor device fabrication process	Moshe Sarfaty, Dimitris Lymberopoulos	2002-09-24	$13,765,000
6413867	Film thickness control using spectral interferometry	Moshe Sarfaty, Lalitha Balasubramhanya, Dimitris Lymberopoulos	2002-07-02	$21,510,000
6368975	Method and apparatus for monitoring a process by employing principal component analysis	Lalitha Balasubramhanya, Moshe Sarfaty, Dimitris Lymberopoulos	2002-04-09	$34,803,000

Jed Davidow — 6 Patents

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