JD

Jed Davidow

Applied Materials: 5 patents #2,165 of 7,310Top 30%
Overall (All Time): #877,171 of 4,157,543Top 25%
6
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6896763 Method and apparatus for monitoring a process by employing principal component analysis Lalitha Balasubramhanya, Moshe Sarfaty, Dimitris Lymberopoulos 2005-05-24
6589869 Film thickness control using spectral interferometry Moshe Sarfaty, Lalitha Balasubramhanya, Dimitris Lymberopoulos 2003-07-08
6521080 Method and apparatus for monitoring a process by employing principal component analysis Lalitha Balasubramhanya, Moshe Sarfaty, Dimitris Lymberopoulos 2003-02-18
6455437 Method and apparatus for monitoring the process state of a semiconductor device fabrication process Moshe Sarfaty, Dimitris Lymberopoulos 2002-09-24
6413867 Film thickness control using spectral interferometry Moshe Sarfaty, Lalitha Balasubramhanya, Dimitris Lymberopoulos 2002-07-02
6368975 Method and apparatus for monitoring a process by employing principal component analysis Lalitha Balasubramhanya, Moshe Sarfaty, Dimitris Lymberopoulos 2002-04-09