Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8903045 | Backscatter system with variable size of detector array | Jeffrey R. Schubert | 2014-12-02 |
| 7551715 | X-ray inspection based on scatter detection | Peter J. Rothschild, Jeffrey R. Schubert, William J. Baukus, William Wade Sapp, Jr., Richard Schueller +1 more | 2009-06-23 |